Full-Length Paper

Journal of Electron Microscopy

Quantitative intensity measurement of equal thickness fringes in Si and MgO crystal images with an energy-filtering transmission electron microscope using an imaging plate,
Koji Nishio, Toshiyuki Isshiki and Makoto Shiojiri,
Journal of Electron Microscopy 49 (2000) 607-619

• Abstract

  Quantitative measurement of intensity profiles of equal thickness fringes has been carried out in Si and MgO crystal images with an energy-filtering transmission electron microscope using an imaging plate. The crystals have a 90° wedge-shape with {110} surfaces for Si and with {100} surfaces for MgO, and are observed under the exact axial incidence of a 200 keV electron beam along the [100] axis for Si and along the [1-10] axis for MgO. The intensities are measured in bright field and 022 and 040 dark field images for Si, and in bright field and 111, 002, 220, 113, 222, and 004 dark field images for MgO, with and without an energy slit having ±5 eV energy width for incident electrons. The intensity profiles obtained from the images are presented as standard experimental data for calculation of electron diffraction intensities. A few simulation programs for high-resolution transmission electron microscopy are checked by comparing the calculated diffraction intensities with the experimental data. The complex potential suitable for matching the data is discussed.

• Manuscript (PDF file, 588,050 bytes)

Proceedings of International Conferences

12th European Congress on Electron Microscopy (Brno, Czech Republic, July 9-14, 2000)

Quantitative measurement of intensity profiles of equal thickness fringes of Si and MgO crystals and estimation of crystal potential,
K. Nishio, T. Isshiki, E. Okunishi, T. Oikawa, M. Kawasaki, H. Endoh and M. Shiojiri,
In: Proceedings of the 12th European Congress on Electron Microscopy, 2000, pp. I125-I126, Brno, Czech Republic

• Proceedings (PDF file, 41,219 bytes)
• Poster (part 1 - 4) (PDF file, 87,000 bytes)
• Poster (part 5 - 8) (PDF file, 92,286 bytes)

3rd Japanese-Polish Joint Seminar on Materials Analysis (Zakopane, Poland, July 16-19, 2000)

Intensity measurement of equal thickness fringes in wedge-shaped crystal images and estimation of crystal potential,
K. Nishio, T. Isshiki and M. Shiojiri,
In: Proceedings of 3rd Japanese-Polish Joint Seminar on Materials Analysis, 2000, pp. 63-64, Zakopane, Poland

• Proceedings (PDF file, 47,372 bytes)
• OHP (1 - 12 pages) (PDF file, 449,000 bytes)

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